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- High Performance Parallel Test Interfaces
TSE provides both dedicated and universal interfaces for high volume production test of FLASH, DRAM and MCPs. TSE’s Test Interface Solutions are ideal for a wide variety of applications including fine pitch and high ball-count BGA packages. TSE’s Test Interface Solutions also support the latest DDR DRAM test which require high speed, low noise and stable signal transfer properties for engineering and high parallelism applications.
Find out more about high performance parallel test interfaces…
- Tester / Handler Integration Kits
Pragmatics provides a variety of proven tester and handler integration kits enabling safe and repeatable docking of your ATE to high volume production and engineering handlers. We also have the talent, experience and resources to design and fabricate unique solutions to fit your needs. We have strong relationships with ATE and handler manufacturers that allows us to provide repeatable, production-rugged solutions for high volume manufacturing anywhere in the world.
Details on our Integration Kits…
- Test Head Manipulators & Adaptor Kits
Pragmatics has a variety of existing designs for Test Head Manipulators for installation, docking, and service of ATE Test Heads. We also work closely with ATE manufacturers to provide reliable solutions to our customers unique requirements.
More information on our Test Head Manipulators…
- CMOS Sensor Test Illumination & Optics
- ATE Diagnostic & Calibration Fixtures
- Load Boards: DRAM, Flash, SOC & MCP
- ATE Test Head Electromechanical Design
- PCB Layout, Design, & Fabrication
- Mechanical Design & Project Management