TSE provides production proven, high performance parallel test interfaces for FLASH, DRAM and MCP applications.
There are two main categories of parallel production test interfaces:
- One-Piece Dedicated Interface
- Two-Piece Interfaces (Universal Interface)
One-Piece Dedicated Interfaces
Supported Handlers
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Two-Piece Production Test Interfaces
Large semiconductor test facilities have migrated from traditional one-piece to two-piece universal final test interfaces:
Cost Reduction
- Only pay for coax and labor once per test head
- Low cost depopulated top boards available for engineering
Engineering to Production Compatibility
- A top board can be populated with only two, four or eight sites for manual test engineering and thermal characterization or small lot qualification with the handler.
- If the device moves into HVM, an electrically compatible, fully populated top board can be provided in two weeks.
Reduce turn-around time for new device qualification
- Top Board turn around time is only two weeks for repeat order
- One piece interface turn around time is typically four weeks
Two-Piece Interfaces
| TSE provides two different types of base boards for two-piece universal interfaces: | |
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ZIF Connector Type
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C-Probe Type
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Applications and Benefits
Applicable Testers
Benefits
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C-Probe Type Two-Piece Interface
Base Board Assembly
Top Board Assembly
Top Board Mounted on Base Board
C-Probes
C-Probe Block Assembly
Socket Guide
Socket Board
Connector Type Two-Piece Interface
T5375 Base Board Assembly
T5375 Top Board Assembly
Cold Test Option
Top Board Assembly
