High Performance Parallel Test Interfaces

TSE provides production proven, high performance parallel test interfaces for FLASH, DRAM and MCP applications.

There are two main categories of parallel production test interfaces:

  • One-Piece Dedicated Interface
  • Two-Piece Interfaces (Universal Interface)

Test Interface Types


One-Piece Dedicated Interfaces

One-Piece Dedicated Interfaces


Supported Handlers

  • Advantest

  • Delta Design

  • Hitachi

  • Mirae

  • Synax

  • TechWing

  • Custom Handlers

Supported Handlers - TSE, Advantest, TechWing

Two-Piece Production Test Interfaces

Large semiconductor test facilities have migrated from traditional one-piece to two-piece universal final test interfaces:

Cost Reduction

  • Only pay for coax and labor once per test head
  • Low cost depopulated top boards available for engineering

Engineering to Production Compatibility

  • A top board can be populated with only two, four or eight sites for manual test engineering and thermal characterization or small lot qualification with the handler.
  • If the device moves into HVM, an electrically compatible, fully populated top board can be provided in two weeks.

Reduce turn-around time for new device qualification

  • Top Board turn around time is only two weeks for repeat order
  • One piece interface turn around time is typically four weeks

Two-Piece Interfaces

TSE provides two different types of base boards for two-piece universal interfaces:
ZIF Connector Type

ZIF Connector Type

  • High density base board to top board interconnect
  • Typically used for FLASH test applications
C-Probe Type

C-Probe Type

  • High performance base board to top board interconnect
  • Typically used for high speed DRAM test applications

Applications and Benefits

Applicable Testers

  • Advantest: T5581, T5365, T5585, T5371, T5375
  • Nextest: Maverick & Magnum
  • Tanisys: M500 & M550
  • Verigy: V5500, HSM3600

Benefits

  • Reduce Lead time
    • Base Board : 4 weeks
    • Top Board : 2 weeks
  • Reduce cost of test
Interface with Protective Cover Removed to Reveal Coax Cabling

C-Probe Type Two-Piece Interface

Base Board Assembly

Base Board Assembly


Top Board Assembly

Top Board Assembly


Top Board Mounted on Base Board

Top Board Mounted on Base Board


C-Probes

C-Probe Types


C-Probe Block Assembly

UTIS-Pogo-Block


Socket Guide

Socket Guide


Socket Board

Socket Board


Connector Type Two-Piece Interface

T5375 Universal Interface


T5375 Base Board Assembly

T5375 Base Board Assembly


T5375 Top Board Assembly

T5375 Top Board Assembly


Cold Test Option

Cold Test Option


Top Board Assembly

Top Board Assembly Sockets